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VLSI Test Principles and Architectures Design for Testability

Laung-Terng Wang-Cheng-Wen Wu-Xiaoqing Wen

VLSI Test Principles and Architectures Design for Testability - Morgan Kaufmann 2006 - The Morgan Kaufmann Series in Systems on Silicon .

ISBN: 9780080474793

Subjects--Topical Terms:
Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.

Subjects--Index Terms: TECHNOLOGY & ENGINEERING / Industrial Design / Product

LC Class. No.: TK7874.75 .V587 2006eb

Dewey Class. No.: 621.39/5

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