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ISTFA 2011 Conference Proceedings From the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California

ASM International.-International Symposium for Testing and Failure Analysis/2011.-Electronic Device Failure Analysis Society.

ISTFA 2011 Conference Proceedings From the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California - ASM International 2011

ISBN: 9781615038503

Subjects--Topical Terms:
Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.

Subjects--Index Terms: TECHNOLOGY & ENGINEERING / Electronics / Microelectronics

LC Class. No.: TK7801 .A241 2011eb

Dewey Class. No.: 621.381

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