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ISTFA 2013 Conference Proceedings From the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA

Electronic Device Failure Analysis Society

ISTFA 2013 Conference Proceedings From the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA - ASM International 2013

ISBN: 9781627080231

Subjects--Topical Terms:
Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.

Subjects--Index Terms: TECHNOLOGY & ENGINEERING / Mechanical

LC Class. No.: TK7871 .I584 2013eb

Dewey Class. No.: 621.381

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