System-on-Chip Test Architectures (Record no. 13782)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00843nam a2200193Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 210820s2008||||xx |||||||||||||| ||und|| |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780080556802 |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.39/5 |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Laung-Terng Wang-Charles E. Stroud-Nur A. Touba |
| 245 #0 - TITLE STATEMENT | |
| Title | System-on-Chip Test Architectures |
| Remainder of title | Nanometer Design for Testability |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Name of publisher | Morgan Kaufmann |
| Year of publication | 2008 |
| 490 ## - SERIES STATEMENT | |
| Series statement | The Morgan Kaufmann Series in Systems on Silicon |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.,Systems on a chip--Testing. |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | TECHNOLOGY & ENGINEERING / Industrial Design / Product |
| 856 ## - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://search.ebscohost.com/login.aspx?direct=true&db=e230xww&scope=site&site=ehost-live&AN=214796 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | E-Books |
| Withdrawn status | Home library | Current library | Date acquired | Koha item type |
|---|---|---|---|---|
| VJEC Central Library | VJEC Central Library | 20/08/2021 | E-Books |