Amazon cover image
Image from Amazon.com

Characterization of High Tc Materials and Devices by Electron Microscopy

By: Browning, Nigel D.-Pennycook, Stephen JMaterial type: TextTextLanguage: English Publication details: Cambridge University Press 2000 ISBN: 9780511039669Subject(s): Electron microscopy--Technique.,High temperature superconductors | TECHNOLOGY & ENGINEERING / Superconductors & SuperconductivityDDC classification: 537.6/23/0284 LOC classification: QC611.98.H54 C43 2000ebOnline resources: Click here to access online
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Date due Barcode
E-Books E-Books VJEC Central Library
Not for loan

There are no comments on this title.

to post a comment.
Copyright © 2021 Vimal Jyothi Engineering College. All Rights Reserved.

Powered by Koha