Advanced Production Testing of RF, SoC, and SiP Devices

TextLanguage: English Series: Artech House Microwave LibraryPublication details: Artech House, Inc. 2007 ISBN: 9781580537100Subject(s): Systems on a chip--Testing | TECHNOLOGY & ENGINEERING / Electronics / Circuits / GeneralDDC classification: 621.3815 LOC classification: TK7895.E42 K45 2007ebOnline resources: Click here to access online

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Item type	Current library	Call number	Status	Date due	Barcode
E-Books	VJEC Central Library		Not for loan

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