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ISTFA '97 Proceedings of the 23rd International Symposium for Testing and Failure Analysis: 27-31 October, 1997, Santa Clara Convention Center, Santa Clara, California

By: Davidson, Grace M.-ASM InternationalMaterial type: TextTextLanguage: English Publication details: ASM International 1997 ISBN: 9781615030828Subject(s): Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses | TECHNOLOGY & ENGINEERING / Electronics / Circuits / GeneralDDC classification: 621.3815/48 LOC classification: TK7871.85 .I57775 1997ebOnline resources: Click here to access online
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