ISTFA '98 Proceedings of the 24th International Symposium for Testing and Failure Analysis: 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
Material type: TextLanguage: English Publication details: ASM International 1998 ISBN: 9781615030767Subject(s): Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses | TECHNOLOGY & ENGINEERING / Electronics / Circuits / GeneralDDC classification: 621.3815/48 LOC classification: TK7871.85 .I48 1998ebOnline resources: Click here to access onlineItem type | Current library | Call number | Status | Date due | Barcode |
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E-Books | VJEC Central Library | Not for loan |
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