Fundamentals Of Atomic Force Microscopy - Part I: Foundations

By: Ronald G ReifenbergerMaterial type: Text

TextLanguage: English Series: Fundamentals of Atomic Force MicroscopyPublication details: World Scientific 2016 ISBN: 9789814630368Subject(s): Atomic force microscopy | SCIENCE / NanoscienceDDC classification: 502.8/2 LOC classification: QH212.A78 R45 2016 pt. 1Online resources: Click here to access online

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
E-Books	VJEC Central Library		Not for loan

There are no comments on this title.

to post a comment.