Peter J. Goodhew-John Humphreys Electron Microscopy and Analysis - Third edition - CRC Press 2017 ISBN: 9781420017250 Subjects--Topical Terms: Electron microscopy. Subjects--Index Terms: TECHNOLOGY & ENGINEERING / Imaging Systems LC Class. No.: QH212.E4 G62 2017 Dewey Class. No.: 502/.8/25