Amir Afshar Principles of Semiconductor Network Testing - Newnes 1995 ISBN: 9780080539560 Subjects--Topical Terms: Integrated circuits--Testing.,Semiconductors--Testing. Subjects--Index Terms: TECHNOLOGY & ENGINEERING / Technical & Manufacturing Industries & Trades LC Class. No.: TK7874 .A339 1995eb Dewey Class. No.: 621.3815/48