TY  - BOOK
AU  - Bahukudumbi, Sudarshan.-Chakrabarty, Krishnendu.
TI  - Wafer-level Testing and Test During Burn-in for Integrated Circuits
T2  - Artech House Integrated Microsystems Series
SN  - 9781596939905
AV  - TK7874 .B35 2010 
U1  - 621.381 
PY  - 2010///
PB  - Artech House, Inc.
KW  - Integrated circuits--Testing.,Integrated circuits--Wafer-scale integration.,Semiconductors--Testing
KW  - TECHNOLOGY & ENGINEERING / Electronics / Microelectronics
UR  - https://search.ebscohost.com/login.aspx?direct=true&db=e230xww&scope=site&site=ehost-live&AN=339508
ER  -