Laung-Terng Wang-Cheng-Wen Wu-Xiaoqing Wen
VLSI Test Principles and Architectures Design for Testability
- Morgan Kaufmann 2006
- The Morgan Kaufmann Series in Systems on Silicon .
9780080474793
Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.
TECHNOLOGY & ENGINEERING / Industrial Design / Product
TK7874.75 .V587 2006eb
621.39/5