TY  - BOOK
AU  - Laung-Terng Wang-Cheng-Wen Wu-Xiaoqing Wen
TI  - VLSI Test Principles and Architectures: Design for Testability
T2  - The Morgan Kaufmann Series in Systems on Silicon
SN  - 9780080474793
AV  - TK7874.75 .V587 2006eb 
U1  - 621.39/5 
PY  - 2006///
PB  - Morgan Kaufmann
KW  - Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing
KW  - TECHNOLOGY & ENGINEERING / Industrial Design / Product
UR  - https://search.ebscohost.com/login.aspx?direct=true&db=e230xww&scope=site&site=ehost-live&AN=189477
ER  -