Laung-Terng Wang-Charles E. Stroud-Nur A. Touba <br/><br/>
System-on-Chip Test Architectures  Nanometer Design for Testability 

 -  Morgan Kaufmann  2008 
 - The Morgan Kaufmann Series in Systems on Silicon .
<br/><br/><label>ISBN: </label>9780080556802 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.,Systems on a chip--Testing.
<br/><br/><label>Subjects--Index Terms: </label>TECHNOLOGY & ENGINEERING / Industrial Design / Product 
<br/><br/><label>LC Class. No.: </label>TK7895.E42 S978 2008eb 
<br/><br/><label>Dewey Class. No.: </label>621.39/5