TY  - BOOK
AU  - Laung-Terng Wang-Charles E. Stroud-Nur A. Touba
TI  - System-on-Chip Test Architectures: Nanometer Design for Testability
T2  - The Morgan Kaufmann Series in Systems on Silicon
SN  - 9780080556802
AV  - TK7895.E42 S978 2008eb 
U1  - 621.39/5 
PY  - 2008///
PB  - Morgan Kaufmann
KW  - Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.,Systems on a chip--Testing
KW  - TECHNOLOGY & ENGINEERING / Industrial Design / Product
UR  - https://search.ebscohost.com/login.aspx?direct=true&db=e230xww&scope=site&site=ehost-live&AN=214796
ER  -