Cher Ming Tan <br/><br/>
Electromigration In Ulsi Interconnections 

 -  World Scientific  2010 
 - International Series on Advances in Solid State Electronics and Technology .
<br/><br/><label>ISBN: </label>9789814273336 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrodiffusion.,Integrated circuits--Ultra large scale integration.
<br/><br/><label>Subjects--Index Terms: </label>TECHNOLOGY & ENGINEERING / Electronics / Semiconductors 
<br/><br/><label>LC Class. No.: </label>TK7874.76 
<br/><br/><label>Dewey Class. No.: </label>621.3815284