Davidson, Grace M.-ASM International. <br/><br/>
ISTFA '97  Proceedings of the 23rd International Symposium for Testing and Failure Analysis: 27-31 October, 1997, Santa Clara Convention Center, Santa Clara, California 

 -  ASM International  1997 
<br/><br/><label>ISBN: </label>9781615030828 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.
<br/><br/><label>Subjects--Index Terms: </label>TECHNOLOGY & ENGINEERING / Electronics / Circuits / General 
<br/><br/><label>LC Class. No.: </label>TK7871.85 .I57775 1997eb 
<br/><br/><label>Dewey Class. No.: </label>621.3815/48