TY  - BOOK
AU  - Davidson, Grace M.-ASM International.
TI  - ISTFA '97: Proceedings of the 23rd International Symposium for Testing and Failure Analysis: 27-31 October, 1997, Santa Clara Convention Center, Santa Clara, California
SN  - 9781615030828
AV  - TK7871.85 .I57775 1997eb 
U1  - 621.3815/48 
PY  - 1997///
PB  - ASM International
KW  - Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses
KW  - TECHNOLOGY & ENGINEERING / Electronics / Circuits / General
UR  - https://search.ebscohost.com/login.aspx?direct=true&db=e230xww&scope=site&site=ehost-live&AN=395816
ER  -