TY  - BOOK
AU  - ASM International.-Electronic Device Failure Analysis Society.
TI  - ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California
SN  - 9781615030866
AV  - TK7871 .I68 2003eb 
U1  - 621.3810287 
PY  - 2003///
PB  - ASM International
KW  - Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses
KW  - TECHNOLOGY & ENGINEERING / Electronics / Digital
UR  - https://search.ebscohost.com/login.aspx?direct=true&db=e230xww&scope=site&site=ehost-live&AN=395862
ER  -