TY  - BOOK
AU  - ASM International.-International Symposium for Testing and Failure Analysis/2011.-Electronic Device Failure Analysis Society.
TI  - ISTFA 2011: Conference Proceedings From the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California
SN  - 9781615038503
AV  - TK7801 .A241 2011eb 
U1  - 621.381 
PY  - 2011///
PB  - ASM International
KW  - Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses
KW  - TECHNOLOGY & ENGINEERING / Electronics / Microelectronics
UR  - https://search.ebscohost.com/login.aspx?direct=true&db=e230xww&scope=site&site=ehost-live&AN=438625
ER  -