TY  - BOOK
AU  - Kim, Young-Jin
TI  - Safety and Structural Integrity 2006
T2  - Diffusion and Defect Data. Pt. B, Solid State Phenomena
SN  - 9783038131373
AV  - TA645 .I588 2005eb 
U1  - 624.171 
PY  - 2007///
PB  - Trans Tech Publications Ltd
KW  - Structural analysis (Engineering)--Congresses.,Structural engineering--Research--Congresses.,Structural stability--Congresses
KW  - TECHNOLOGY & ENGINEERING / Materials Science / General
UR  - https://search.ebscohost.com/login.aspx?direct=true&db=e230xww&scope=site&site=ehost-live&AN=646262
ER  -