TY  - BOOK
AU  - Stevie, F. A.
TI  - Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
T2  - Materials Characterization and Analysis Collection
SN  - 9781606505892
AV  - QD96.S43 S747 2016 
U1  - 543.0873 
PY  - 2016///
PB  - Momentum Press
KW  - Secondary ion mass spectrometry
KW  - TECHNOLOGY & ENGINEERING / Materials Science / General
UR  - https://search.ebscohost.com/login.aspx?direct=true&db=e230xww&scope=site&site=ehost-live&AN=1079552
ER  -