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Electron Microscopy and Analysis

By: Peter J. Goodhew-John HumphreysMaterial type: TextTextLanguage: English Publication details: CRC Press 2017 Edition: Third editionISBN: 9781420017250Subject(s): Electron microscopy | TECHNOLOGY & ENGINEERING / Imaging SystemsDDC classification: 502/.8/25 LOC classification: QH212.E4 G62 2017Online resources: Click here to access online
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