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1.
VLSI Test Principles and Architectures Design for Testability

by Laung-Terng Wang-Cheng-Wen Wu-Xiaoqing Wen.

Series: The Morgan Kaufmann Series in Systems on SiliconMaterial type: Text Text Language: English Publication details: Morgan Kaufmann 2006Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1).

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2.
System-on-Chip Test Architectures Nanometer Design for Testability

by Laung-Terng Wang-Charles E. Stroud-Nur A. Touba.

Series: The Morgan Kaufmann Series in Systems on SiliconMaterial type: Text Text Language: English Publication details: Morgan Kaufmann 2008Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1).

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