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System-on-Chip Test Architectures Nanometer Design for Testability

By: Laung-Terng Wang-Charles E. Stroud-Nur A. ToubaMaterial type: TextTextLanguage: English Series: The Morgan Kaufmann Series in Systems on SiliconPublication details: Morgan Kaufmann 2008 ISBN: 9780080556802Subject(s): Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.,Systems on a chip--Testing | TECHNOLOGY & ENGINEERING / Industrial Design / ProductDDC classification: 621.39/5 LOC classification: TK7895.E42 S978 2008ebOnline resources: Click here to access online
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