Amazon cover image
Image from Amazon.com

VLSI Test Principles and Architectures Design for Testability

By: Laung-Terng Wang-Cheng-Wen Wu-Xiaoqing WenMaterial type: TextTextLanguage: English Series: The Morgan Kaufmann Series in Systems on SiliconPublication details: Morgan Kaufmann 2006 ISBN: 9780080474793Subject(s): Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing | TECHNOLOGY & ENGINEERING / Industrial Design / ProductDDC classification: 621.39/5 LOC classification: TK7874.75 .V587 2006ebOnline resources: Click here to access online
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Date due Barcode
E-Books E-Books VJEC Central Library
Not for loan

There are no comments on this title.

to post a comment.
Copyright © 2021 Vimal Jyothi Engineering College. All Rights Reserved.
Supported by OpenSio Software Solutions

Powered by Koha