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Electromigration In Ulsi Interconnections

By: Cher Ming TanMaterial type: TextTextLanguage: English Series: International Series on Advances in Solid State Electronics and TechnologyPublication details: World Scientific 2010 ISBN: 9789814273336Subject(s): Electrodiffusion.,Integrated circuits--Ultra large scale integration | TECHNOLOGY & ENGINEERING / Electronics / SemiconductorsDDC classification: 621.3815284 LOC classification: TK7874.76Online resources: Click here to access online
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