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	1.	Multigroup Equations For The Description Of The Particle Transport In Semiconductors by Martin Galler. Series: Series on Advances in Mathematics for Applied SciencesMaterial type: Text Language: English Publication details: World Scientific 2005Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	2.	Advanced Mathematical And Computational Tools In Metrology Vii by Patrizia Ciarlini-Eduarda Filipe-Alistair B Forbes-Franco Pavese-Christophe Perruchet-Bernd R L Siebert. Series: Series on Advances in Mathematics for Applied SciencesMaterial type: Text Language: English Publication details: World Scientific 2006Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	3.	Wavelet And Wave Analysis As Applied To Materials With Micro Or Nanostructure by Carlo Cattani-Jarema Jaroslavich Rushchitski. Series: Series on Advances in Mathematics for Applied SciencesMaterial type: Text Language: English Publication details: World Scientific 2007Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	4.	Applied And Industrial Mathematics In Italy Iii - Proceedings Of The 9th Conference Simai by Enrico De Bernardis-Renato Spigler-Vanda Valente. Series: Series on Advances in Mathematics for Applied SciencesMaterial type: Text Language: English Publication details: World Scientific 2010Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	5.	Stability Criteria For Fluid Flows by Lidia Palese-Adelina Georgescu. Series: Series on Advances in Mathematics for Applied SciencesMaterial type: Text Language: English Publication details: World Scientific 2010Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	6.	Advanced Mathematical And Computational Tools In Metrology And Testing Ix by Franco Pavese-Markus Baer-Jean-remy Filtz-Alistair B Forbes-Leslie Pendrill-Kastsuhiro Shirono. Series: Series on Advances in Mathematics for Applied SciencesMaterial type: Text Language: English Publication details: World Scientific 2012Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)

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