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Advanced Mathematical And Computational Tools In Metrology And Testing Ix

By: Franco Pavese-Markus Baer-Jean-remy Filtz-Alistair B Forbes-Leslie Pendrill-Kastsuhiro ShironoMaterial type: TextTextLanguage: English Series: Series on Advances in Mathematics for Applied SciencesPublication details: World Scientific 2012 ISBN: 9789814397957Subject(s): Measurement--Congresses.,Metrology--Congresses.,Physical measurements--Congresses | MATHEMATICS / AppliedDDC classification: 530.8 LOC classification: QA465 .A58 2012ebOnline resources: Click here to access online
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