Secondary Ion Mass Spectrometry Applications for Depth Profiling and Surface Characterization
Material type: TextLanguage: English Series: Materials Characterization and Analysis CollectionPublication details: Momentum Press 2016 ISBN: 9781606505892Subject(s): Secondary ion mass spectrometry | TECHNOLOGY & ENGINEERING / Materials Science / GeneralDDC classification: 543.0873 LOC classification: QD96.S43 S747 2016Online resources: Click here to access onlineItem type | Current library | Call number | Status | Date due | Barcode |
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E-Books | VJEC Central Library | Not for loan |
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