Characterization of High Tc Materials and Devices by Electron Microscopy
Material type: TextLanguage: English Publication details: Cambridge University Press 2000 ISBN: 9780511039669Subject(s): Electron microscopy--Technique.,High temperature superconductors | TECHNOLOGY & ENGINEERING / Superconductors & SuperconductivityDDC classification: 537.6/23/0284 LOC classification: QC611.98.H54 C43 2000ebOnline resources: Click here to access onlineItem type | Current library | Call number | Status | Date due | Barcode |
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E-Books | VJEC Central Library | Not for loan |
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