| 000 | 00843nam a2200193Ia 4500 | ||
|---|---|---|---|
| 008 | 210820s2008||||xx |||||||||||||| ||und|| | ||
| 020 | _a9780080556802 | ||
| 041 | _aeng | ||
| 050 | _aTK7895.E42 S978 2008eb | ||
| 082 | _a621.39/5 | ||
| 100 | _aLaung-Terng Wang-Charles E. Stroud-Nur A. Touba | ||
| 245 | 0 |
_aSystem-on-Chip Test Architectures _bNanometer Design for Testability |
|
| 260 |
_bMorgan Kaufmann _c2008 |
||
| 490 | _aThe Morgan Kaufmann Series in Systems on Silicon | ||
| 650 | _aIntegrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.,Systems on a chip--Testing. | ||
| 653 | _aTECHNOLOGY & ENGINEERING / Industrial Design / Product | ||
| 856 | _uhttps://search.ebscohost.com/login.aspx?direct=true&db=e230xww&scope=site&site=ehost-live&AN=214796 | ||
| 942 | _cEBK | ||
| 999 |
_c13782 _d13782 |
||