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ISTFA 2003 Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California

ASM International.-Electronic Device Failure Analysis Society.

ISTFA 2003 Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California - ASM International 2003

ISBN: 9781615030866

Subjects--Topical Terms:
Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.

Subjects--Index Terms: TECHNOLOGY & ENGINEERING / Electronics / Digital

LC Class. No.: TK7871 .I68 2003eb

Dewey Class. No.: 621.3810287

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