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ISTFA 2003 Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California

By: ASM International.-Electronic Device Failure Analysis SocietyMaterial type: TextTextLanguage: English Publication details: ASM International 2003 ISBN: 9781615030866Subject(s): Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses | TECHNOLOGY & ENGINEERING / Electronics / DigitalDDC classification: 621.3810287 LOC classification: TK7871 .I68 2003ebOnline resources: Click here to access online
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