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ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA

Electronic Device Failure Analysis Society.-ASM International.

ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA - ASM International 2007

ISBN: 9781615030903

Subjects--Topical Terms:
Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.

Subjects--Index Terms: TECHNOLOGY & ENGINEERING / Electronics / Circuits / General

LC Class. No.: TK7871 .I6847 2007eb

Dewey Class. No.: 621.3815/48

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