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ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA

By: Electronic Device Failure Analysis Society.-ASM InternationalMaterial type: TextTextLanguage: English Publication details: ASM International 2007 ISBN: 9781615030903Subject(s): Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses | TECHNOLOGY & ENGINEERING / Electronics / Circuits / GeneralDDC classification: 621.3815/48 LOC classification: TK7871 .I6847 2007ebOnline resources: Click here to access online
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