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ISTFA 2011 Conference Proceedings From the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California

By: ASM International.-International Symposium for Testing and Failure Analysis/2011.-Electronic Device Failure Analysis SocietyMaterial type: TextTextLanguage: English Publication details: ASM International 2011 ISBN: 9781615038503Subject(s): Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses | TECHNOLOGY & ENGINEERING / Electronics / MicroelectronicsDDC classification: 621.381 LOC classification: TK7801 .A241 2011ebOnline resources: Click here to access online
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