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Results of search for 'ccl=Provider:ASM International and au:Electronic Device Failure Analysis Society.-ASM International and au:Electronic Device Failure Analysis Society.-ASM International'
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1.
ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis: 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California
by
Electronic Device Failure Analysis Society.-ASM International.
Material type:
Text
Language:
English
Publication details:
ASM International
2001
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2.
ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California
by
Electronic Device Failure Analysis Society.-ASM International.
Material type:
Text
Language:
English
Publication details:
ASM International
2005
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3.
ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA
by
Electronic Device Failure Analysis Society.-ASM International.
Material type:
Text
Language:
English
Publication details:
ASM International
2007
Online access:
Click here to access online
Availability:
Items available for reference:
VJEC Central Library: Not for loan
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