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1.
ISTFA 2003 Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California

by ASM International.-Electronic Device Failure Analysis Society.

Material type: Text Text Language: English Publication details: ASM International 2003Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1).

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2.
Microelectronics Failure Analysis Desk Reference

by ASM International.-Electronic Device Failure Analysis Society.

Material type: Text Text Language: English Publication details: ASM International 2004Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1).

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3.
ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA

by ASM International.-Electronic Device Failure Analysis Society.

Material type: Text Text Language: English Publication details: ASM International 2006Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1).

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