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1.
ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis: 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California

by Electronic Device Failure Analysis Society.-ASM International.

Material type: Text Text Language: English Publication details: ASM International 2001Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1).

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2.
ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California

by Electronic Device Failure Analysis Society.-ASM International.

Material type: Text Text Language: English Publication details: ASM International 2005Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1).

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3.
ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA

by Electronic Device Failure Analysis Society.-ASM International.

Material type: Text Text Language: English Publication details: ASM International 2007Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1).

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4.
Microelectronics Failure Analysis Desk Reference

by Ross, Richard J.-Electronic Device Failure Analysis Society.-ASM International.

Edition: 6th edMaterial type: Text Text Language: English Publication details: ASM International 2011Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1).

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