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ISTFA 2013 Conference Proceedings From the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA

By: Electronic Device Failure Analysis SocietyMaterial type: TextTextLanguage: English Publication details: ASM International 2013 ISBN: 9781627080231Subject(s): Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses | TECHNOLOGY & ENGINEERING / MechanicalDDC classification: 621.381 LOC classification: TK7871 .I584 2013ebOnline resources: Click here to access online
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