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	1.	Microelectronic Failure Analysis Desk Reference: 2001 Supplement by Electronic Device Failure Analysis Society. Edition: [4th ed.]Material type: Text Language: English Publication details: ASM International 2001Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	2.	ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis: 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California by Electronic Device Failure Analysis Society.-ASM International. Material type: Text Language: English Publication details: ASM International 2001Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	3.	Microelectronic Failure Analysis Desk Reference: 2002 Supplement by Electronic Device Failure Analysis Society. Material type: Text Language: English Publication details: ASM International 2002Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	4.	ISTFA 2003 Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California by ASM International.-Electronic Device Failure Analysis Society. Material type: Text Language: English Publication details: ASM International 2003Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	5.	Microelectronics Failure Analysis Desk Reference by ASM International.-Electronic Device Failure Analysis Society. Material type: Text Language: English Publication details: ASM International 2004Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	6.	ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California by Electronic Device Failure Analysis Society.-ASM International. Material type: Text Language: English Publication details: ASM International 2005Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	7.	ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA by ASM International.-Electronic Device Failure Analysis Society. Material type: Text Language: English Publication details: ASM International 2006Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	8.	ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA by Electronic Device Failure Analysis Society.-ASM International. Material type: Text Language: English Publication details: ASM International 2007Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	9.	Microelectronics Failure Analysis Desk Reference by Ross, Richard J.-Electronic Device Failure Analysis Society.-ASM International. Edition: 6th edMaterial type: Text Language: English Publication details: ASM International 2011Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	10.	ISTFA 2011 Conference Proceedings From the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California by ASM International.-International Symposium for Testing and Failure Analysis/2011.-Electronic Device Failure Analysis Society. Material type: Text Language: English Publication details: ASM International 2011Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)
	11.	ISTFA 2013 Conference Proceedings From the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA by Electronic Device Failure Analysis Society. Material type: Text Language: English Publication details: ASM International 2013Online access: Click here to access online Availability: Items available for reference: VJEC Central Library: Not for loan (1). Add to cart (remove)

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